Electronic Design

Ring-Oscillator Process Monitors for Wafer-Level CMOS Screening

Ring-oscillator process monitors give production test teams a fast on-die frequency measurement for identifying CMOS process ...
Semiconductor Engineering

Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle

A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...
Semiconductor Engineering

Customized On-Chip Process Monitors

The sensitivity of digital circuits to process variations is continuously increasing with scaling in MOSFET devices. The effect of process variations has a substantial impact on the power, performance ...