Austin, TX. NI today announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ...

The PXI Digital Pattern Instrument brings ATE-class digital to the PXI platform through features and programming that are familiar to semiconductor test engineers. Those features not only come through ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.