Glass Magazine

k-Space Introduces Machine Learning Upgrade for Inline Glass Defect Detection

Space Associates, Inc., a provider of advanced metrology and inspection solutions, announced new machine learning capabilities for its kSA Glass Breakage & Defect Detection tool. The enhancement adds ...
Semiconductor Engineering

Wafer Bin Map Defect Classification Using Semi-Supervised Learning

A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
pv magazine International

Ensemble deep learning for PV cell defect detection

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Computer Weekly

Data classification: What it is and why you need it

CIOs and IT directors working on any project that involves data in any way are always more likely to succeed when the organisation has a clear view of the data it holds. Increasingly, organisations ...
Forbes

How AI Is Transforming Data Classification

In today's digital landscape, organizations face an unprecedented challenge: managing and protecting ever-growing volumes of data spread across multiple environments. As someone deeply involved in ...